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Bilde av Johansen, Jarle André
Bilde av Johansen, Jarle André
Associate Professor Department of Automation and Process Engineering jarle.johansen@uit.no +4777660366 95724923 You can find me here

Jarle André Johansen

  • Hui Xue, Bjørn-Morten Batalden, Puneet Sharma, Jarle André Johansen, Dilip K. Prasad :
    Biosignal-Based Driving Skill Classification Using Machine Learning: A Case Study of Maritime Navigation
    Applied Sciences 2021 ARKIV / DOI
  • Yngve Birkelund, Jarle André Johansen, Alfred Hanssen :
    High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
    European Signal Processing Conference 2015 DOI
  • Jarle André Johansen, Bernt Inge Hansen :
    Experimental results on the pressure dependence of the minnaert resonance frequency for three different gases in water
    Proceedings - IEEE Ultrasonics Symposium 2015 DOI
  • Bernt Inge Hansen, Jarle André Johansen :
    Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
    Proceedings - IEEE Ultrasonics Symposium 2011 DOI
  • Jarle Andre Johansen, Zhenrong Jin, John D. Cressler, Y Cui, G Niu, Q Liang et al.:
    On the scaling limits of low-frequency noise in SiGe HBTs
    Solid-State Electronics 2004 DOI
  • Jarle Andre Johansen, Zhenrong Jin, John D. Cressler, Y Cui, G Niu, Q Liang et al.:
    On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
    Solid-State Electronics 2004
  • Zhenrong Jin, Jarle Andre Johansen, John D. Cressler, Robert A. Reed, Paul W. Marshall, Alvin J. Joseph :
    Using proton irradiation to probe the origins of low-frequency noise variations in SiGeHBTs
    IEEE Transactions on Nuclear Science 2004
  • Xuyuan Chen, Jarle Andre Johansen, Cora Salm, Arthur D. Van Rheenen :
    On low-frequency noise of polycrystalline GeSi for sub-micron CMOS technologies
    Solid-State Electronics 2001
  • Xuyuan Chen, Jarle Andre Johansen, Arthur D. Van Rheenen, Cora Salm :
    On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies”
    Solid-State Electronics 2000
  • Jarle André Johansen, Kåre Edvardsen, Puneet Sharma, Hassan Abbas Khawaja :
    Measuring the Sea Spray Flux using High-Speed Camera
    2015 ARKIV
  • Bernt Inge Hansen, Jarle André Johansen :
    Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
    2011
  • Jarle Andre Johansen, Peng Qi :
    Model-Based Low-Frequency Noise Power Spectrum Density Fitting in SiGe HBTs
    2007 OMTALE
  • Yngve Birkelund, Alfred Hanssen, Jarle Andre Johansen :
    High-precision surrogate based tests for gaussianity and linearity
    2004
  • Yngve Birkelund, Jarle Andre Johansen, John D. Cressler, Zhenrong Jin :
    A statistical tool for probing the coupling between noisytraps in semiconductor devices, with application to 1/f noise in SiGe HBTs
    2004
  • Jarle Andre Johansen :
    Low-frequency Noise Characterization of Silicon-Germanium Resistors and Devices
    UiT Norges arktiske universitet 2004
  • Yngve Birkelund, Jarle Andre Johansen, Alfred Hanssen :
    High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
    2004
  • Jarle Andre Johansen, Yngve Birkelund, Zhenrong Jin, John D. Cressler :
    A Statistical Tool For Probing the Coupling Between Noisy Traps in Semiconductor Devices, With Application to 1/f Noise in SiGe HBTs
    2004
  • Jarle Andre Johansen :
    Lavfrekevnt støy i Silisium-Germanium transistorer
    2004
  • Yngve Birkelund, Alfred Hanssen, Jarle Andre Johansen, Arthur D. van Rheenen, John D. Cressler :
    Time series analysis of low-frequency noise in SiGe HBTs
    2003
  • Jarle Andre Johansen, Zhenrong Jin, John D. Cressler, Alvin J. Joseph :
    Geometry-Dependent Low-frequency Noise Variations in 120 GHz fT SiGe HBTs
    2003
  • Zhenrong Jin, Jarle Andre Johansen, John D. Cressler, Robert A. Reed, Paul W. Marshall, Alvin J. Joseph :
    Using Proton Irradiation to Probe the Origins of Low-frequency Noise Variations in SiGe HBTs
    2003
  • Jarle Andre Johansen, Zhenrong Jin, John D. Cressler, Yan Cui, Guofu Niu, Qingqing Liang et al.:
    On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
    2003
  • Chendong Zhu, Qingqing Liang, Ragad Al-Huq, John D. Cressler, Alvin J. Joseph, Jarle Andre Johansen et al.:
    An Investigation of the Damage Mechanism in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs
    2003
  • Yngve Birkelund, Jarle Andre Johansen, Alfred Hanssen, John D. Cressler, Arthur D. Van Rheenen :
    Time Series Analysis of Low-Frequency Noise in SiGe HBTs
    2003
  • Xuyuan Chen, Jarle Andre Johansen, C. L. Liu :
    Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers
    2001
  • Jarle Andre Johansen, Hallvar Figenschau, Xuyuan Chen, Arthur D. Van Rheenen, Cora Salm :
    Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs
    2001
  • Xuyuan Chen, Jarle Andre Johansen, Arthur D. Van Rheenen, Cora Salm :
    On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies
    2000
  • Jarle Andre Johansen, Xuyuan Chen, Arthur D. Van Rheenen :
    Study of low-frequency noise in polycrystaline GexSi1-x
    2000
  • Xuyuan Chen, Jarle Andre Johansen, Cora Salm, Arthur D. Van Rheenen :
    On Low-Frequency Noise Of Polycrystalline GeSi For Sub-Micron CMOS Technologies
    2000

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    Research interests

    Sensor technology

    Semiconductor technology

    Teaching

    Electronics

    Control Techniques

    Industrial Data Communications

    Programming (LabVIEW)