Worshop given by Dr. Sergio Santos and Chia Yun Lai from the Department of Physics and Technology
In this workshop we will discuss practical methods to image and characterize surfaces with nanoscale resolution with the AFM.
Measuring mechanical and chemical properties is now possible and relatively simple. Measure nanoscale features of organic and inorganic materials from DNA and proteins to imperfections in graphene or the growth of nanoscale terraces.
Two talks of 20 minutes will be accessible and comprehensible to anybody with an interest in nanotechnology.
The talks will be open, relatively informal and with a view to supporting anybody with an interest and with questions regarding the type of measurements that are now possible.